Tobing, L.Y.M.L.Y.M.TobingDumon, PieterPieterDumonBaets, RoelRoelBaetsChin, M.-K.M.-K.Chin2021-10-172021-10-172008-090146-9592https://imec-publications.be/handle/20.500.12860/14564Demonstration of defect modes in coupled microresonator arrays fabricated in silicon-on-insulator technologyJournal article