STT-MRAM Stochastic and Defects-aware DTCO for Last Level Cache at Advanced Process Nodes

Garcia-Redondo, F.F.Garcia-RedondoRao, SiddharthSiddharthRaoGupta, MohitMohitGuptaPerumkunnil, ManuManuPerumkunnilXiang, YangYangXiangAbdi, DawitDawitAbdiVan Beek, SimonSimonVan BeekCouet, SebastienSebastienCouetGarcia Bardon, MarieMarieGarcia Bardon2024-05-062023-11-242024-05-0620231930-8876WOS:001090588900025https://imec-publications.be/handle/20.500.12860/43178STT-MRAM Stochastic and Defects-aware DTCO for Last Level Cache at Advanced Process NodesProceedings paper10.1109/ESSDERC59256.2023.10268481979-8-3503-0423-7WOS:001090588900025