Empirical relationship between the low-frequency noise spectral density and the transconductance of silicon-on-insulator n-channel metal-oxide-semiconductor transistors

Simoen, EddyEddySimoenClaeys, CorCorClaeys2021-09-292021-09-291994https://imec-publications.be/handle/20.500.12860/346Empirical relationship between the low-frequency noise spectral density and the transconductance of silicon-on-insulator n-channel metal-oxide-semiconductor transistorsJournal article