Simoen, EddyEddySimoenRitzenthaler, RomainRomainRitzenthalerSchram, TomTomSchramArimura, HiroakiHiroakiArimuraHoriguchi, NaotoNaotoHoriguchiClaeys, CorCorClaeys2021-10-262021-10-262018https://imec-publications.be/handle/20.500.12860/31788On the low-frequency noise of high-k gate stacks: what did we learn?Proceedings paperhttps://ieeexplore.ieee.org/document/8565820