Ohyama, HidenoriHidenoriOhyamaVanhellemont, JanJanVanhellemontSimoen, EddyEddySimoenClaeys, C.C.ClaeysTakami, Y.Y.TakamiHayama, KiyoteruKiyoteruHayamaYoshimoto, K.K.YoshimotoSunaga, H.H.SunagaKobayashi, K.K.Kobayashi2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1382Substrate effects on the degradation of irradiated Si diodesProceedings paper