Comparison of micro-electronic test structures for noise measurement verification

Van Den Bosch, SvenSvenVan Den BoschDe Ketelaere, WimWimDe KetelaereMartens, LucLucMartensDe Vos, JoeriJoeriDe Vos2021-10-142021-10-141999https://imec-publications.be/handle/20.500.12860/3914Comparison of micro-electronic test structures for noise measurement verificationProceedings paper