Effect of irradiation temperature on radiation damage in electron-irradiated MOS FETs

Ohyama, H.H.OhyamaHayama, K.K.HayamaTakakura, K.K.TakakuraJono, T.T.JonoSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7936Effect of irradiation temperature on radiation damage in electron-irradiated MOS FETsJournal article