Cartier, EduardEduardCartierPantisano, LuigiLuigiPantisanoKerber, AndreasAndreasKerberGroeseneken, GuidoGuidoGroeseneken2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/7288Correlation between charge Injection and trapping in SiO2/HfO2 gate stacksOral presentation