Temperature profile measurement and failure characterization of ESD protection devices using spectroscopic photon emission microscopy and Raman spectroscopy

Rasras, MahmoudMahmoudRasrasDe Wolf, IngridIngridDe WolfGroeseneken, GuidoGuidoGroesenekenChen, JianJianChenBock, KarlheinzKarlheinzBockMaes, HermanHermanMaes2021-10-142021-10-141999https://imec-publications.be/handle/20.500.12860/3771Temperature profile measurement and failure characterization of ESD protection devices using spectroscopic photon emission microscopy and Raman spectroscopyProceedings paper