Ohyama, HidenoriHidenoriOhyamaVanhellemont, JanJanVanhellemontSimoen, EddyEddySimoenClaeys, CorCorClaeysTakami, Y.Y.TakamiHayama, KiyoteruKiyoteruHayamaHakata, T.T.HakataSunaga, H.H.SunagaKobayashi, K.K.Kobayashi2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1383Influence of the substrate on the degradation of irradiated Si diodesJournal article