Understanding and variability of lateral charge migration in 3D CT-NAND flash with and without band-gap engineered barriers

Padovani, AndreaAndreaPadovaniPesic, MilanMilanPesicAnik Kumar, MondolMondolAnik KumarBlomme, PieterPieterBlommeSubirats, AlexandreAlexandreSubiratsVadakupudhu Palayam, SenthilSenthilVadakupudhu PalayamBaten, ZunaidZunaidBatenLarcher, LucaLucaLarcherVan den Bosch, GeertGeertVan den Bosch2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/33721Understanding and variability of lateral charge migration in 3D CT-NAND flash with and without band-gap engineered barriersProceedings paperhttps://ieeexplore.ieee.org/document/8720566