Labie, RietRietLabieBeyne, EricEricBeyneMertens, RobertRobertMertensRatchev, PetarPetarRatchevHumbeeck, J.V.J.V.Humbeeck2021-10-152021-10-152003-12https://imec-publications.be/handle/20.500.12860/7763Investigation of the reliability of Cu and Co UBM layers in thermal-cycling testsProceedings paper