Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions

Saraza-Canflanca, PabloPabloSaraza-CanflancaRodriguez, RosanaRosanaRodriguezMartin-Martinez, JavierJavierMartin-MartinezCastro-Lopez, RafaelRafaelCastro-LopezRoca, ElisendaElisendaRocaV. Fernandez, FanciscoFanciscoV. FernandezNafria, MontserratMontserratNafriaDiaz Fortuny, JavierJavierDiaz Fortuny2021-11-252021-11-022021-11-2520210038-1101WOS:000701908200013https://imec-publications.be/handle/20.500.12860/37527Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditionsJournal article10.1016/j.sse.2021.108037WOS:000701908200013INSTABILITIES