Border traps in InGaAs nMOSFETs assessed by low-frequency noise

Scarpino, MercedesMercedesScarpinoGupta, SomyaSomyaGuptaLin, DennisDennisLinAlian, AliRezaAliRezaAlianCrupi, FeliceFeliceCrupiCollaert, NadineNadineCollaertThean, AaronAaronTheanSimoen, EddyEddySimoen2021-10-222021-10-2220140741-3106https://imec-publications.be/handle/20.500.12860/24487Border traps in InGaAs nMOSFETs assessed by low-frequency noiseJournal articlehttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6819797&queryText%3DBorder+traps+in+InGaAs+nMOSFETs+assessed+by+l