Nanoscale 3D characterisation of soft organic material using conductive scanning probe tomography

Chintala, Ravi ChandraRavi ChandraChintalaWood, SebastianSebastianWoodBlakesley, James C.James C.BlakesleyFavia, PaolaPaolaFaviaCelano, UmbertoUmbertoCelanoParedis, KristofKristofParedisVandervorst, WilfriedWilfriedVandervorstCastro, Fernando A.Fernando A.Castro2021-10-272021-10-2720192158-3226https://imec-publications.be/handle/20.500.12860/32707Nanoscale 3D characterisation of soft organic material using conductive scanning probe tomographyJournal articlehttps://doi.org/10.1063/1.5066458