Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room to Low Temperatures

Lorenzelli, FrancescoFrancescoLorenzelliElsayed, AsserAsserElsayedGodfrin, ClementClementGodfrinGrill, AlexanderAlexanderGrillKubicek, StefanStefanKubicekLi, RoyRoyLiStucchi, MicheleMicheleStucchiWan, DannyDannyWanDe Greve, KristiaanKristiaanDe GreveMarinissen, Erik JanErik JanMarinissenGielen, GeorgesGeorgesGielen2024-11-042024-09-182024-11-042023-12-222378-2250https://imec-publications.be/handle/20.500.12860/44517Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room to Low TemperaturesProceedings paper10.1109/ITC51656.2023.00031Electrical & electronic engineering