Kaczer, BenBenKaczerRoussel, PhilippePhilippeRousselGrasser, TiborTiborGrasserGroeseneken, GuidoGuidoGroeseneken2021-10-182021-10-1820100741-3106https://imec-publications.be/handle/20.500.12860/17337Statistics of multiple trapped charges in the gate oxide of deeply scaled MOSFET devices – application to NBTIJournal articlehttp://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=5443509