Impact of probe-to-pad contact degradation on the high-frequency charateristics of RF MOSFETs and guidelines to avoid it

Vandamme, EwoutEwoutVandammeSchreurs, DominiqueDominiqueSchreursVan Dinther, G.G.Van Dinther2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5760Impact of probe-to-pad contact degradation on the high-frequency charateristics of RF MOSFETs and guidelines to avoid itJournal article