Hot electron degradation of the DC and microwave performance of InAlAs/InGaAs/InP HEMTs

Menozzi, RRMenozziBorgarino, M.M.BorgarinoBaeyens, YvesYvesBaeyensVan Hove, MarleenMarleenVan HoveFantini, F.F.Fantini2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1346Hot electron degradation of the DC and microwave performance of InAlAs/InGaAs/InP HEMTsProceedings paper