Measuring nonlinear devices to retrieve good system-level models

De Locht, LudwigLudwigDe LochtVandersteen, GerdGerdVandersteenRolain, YvesYvesRolainRabijns, DaanDaanRabijns2021-10-162021-10-162005https://imec-publications.be/handle/20.500.12860/10302Measuring nonlinear devices to retrieve good system-level modelsOral presentation