Vandemaele, MichielMichielVandemaeleKaczer, BenBenKaczerTyaginov, StanislavStanislavTyaginovFranco, JacopoJacopoFrancoBury, ErikErikBuryVaisman Chasin, AdrianAdrianVaisman ChasinMakarov, AlexanderAlexanderMakarovHellings, GeertGeertHellingsGroeseneken, GuidoGuidoGroeseneken2023-06-292023-04-302023-06-2920230741-3106WOS:000966186700001https://imec-publications.be/handle/20.500.12860/41512Trapping of Hot Carriers in the Forksheet FET Wall: A TCAD StudyJournal article10.1109/LED.2022.3229763WOS:000966186700001