Diamond tip based automated two-point electrical probing on the nanoscale

Hantschel, ThomasThomasHantschelArstila, KaiKaiArstilaOlanterae, LauriLauriOlanteraeVandervorst, WilfriedWilfriedVandervorst2021-10-182021-10-182010https://imec-publications.be/handle/20.500.12860/17219Diamond tip based automated two-point electrical probing on the nanoscaleOral presentation