A new quantitative model to predict SILC-related disturb characteristics in Flash E2PROM devices

De Blauwe, JanJanDe BlauweVan Houdt, JanJanVan HoudtWellekens, DirkDirkWellekensDegraeve, RobinRobinDegraeveRoussel, PhilippePhilippeRousselHaspeslagh, LucLucHaspeslaghDeferm, LudoLudoDefermGroeseneken, GuidoGuidoGroesenekenMaes, HermanHermanMaes2021-09-292021-09-291996https://imec-publications.be/handle/20.500.12860/1150A new quantitative model to predict SILC-related disturb characteristics in Flash E2PROM devicesProceedings paper