Huynen, MartijnMartijnHuynenKapusuz, Kamil YavuzKamil YavuzKapusuzDe Zutter, DanielDanielDe ZutterVande Ginste, DriesDriesVande Ginste2021-10-272021-10-272019https://imec-publications.be/handle/20.500.12860/33188An enhanced differential surface admittance operator for the signal integrity modeling of interconnectsProceedings paper