Acurio Mendez, ElianaElianaAcurio MendezCrupi, FeliceFeliceCrupiRonchi, NicoloNicoloRonchiDe Jaeger, BriceBriceDe JaegerBakeroot, BenoitBenoitBakerootDecoutere, StefaanStefaanDecoutereTrojman, LionelLionelTrojman2021-10-252021-10-2520180018-9383https://imec-publications.be/handle/20.500.12860/30063Reliability improvements in AlGaN/GaN Schottky barrier diodes with a gated edge terminationJournal articlehttps://ieeexplore.ieee.org/document/8334204/