Techniques for reducing the number of decisions and backtracks in combinational test generation

Sahraoui, Z.Z.SahraouiCatthoor, FranckyFranckyCatthoorSix, PaulPaulSixDe Man, HugoHugoDe Man2021-10-012021-10-011998https://imec-publications.be/handle/20.500.12860/2922Techniques for reducing the number of decisions and backtracks in combinational test generationJournal article