Self-heating-aware CMOS reliability characterization using degradation maps

Bury, ErikErikBuryVaisman Chasin, AdrianAdrianVaisman ChasinKaczer, BenBenKaczerChuang, KentKentChuangFranco, JacopoJacopoFrancoSimicic, MarkoMarkoSimicicWeckx, PieterPieterWeckxLinten, DimitriDimitriLinten2021-10-252021-10-252018https://imec-publications.be/handle/20.500.12860/30343Self-heating-aware CMOS reliability characterization using degradation mapsProceedings paperhttps://ieeexplore.ieee.org/document/8353541/