Electrical stress on irradiated thin gate oxide partially depleted SOI nMOSFETs

Rafi, J.M.J.M.RafiSimoen, EddyEddySimoenMercha, AbdelkarimAbdelkarimMerchaHayama, K.K.HayamaCampabadal, F.F.CampabadalOhyama, H.H.OhyamaClaeys, CorCorClaeys2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12750Electrical stress on irradiated thin gate oxide partially depleted SOI nMOSFETsJournal article