Li, AngAngLiVan Vaerenbergh, ThomasThomasVan VaerenberghDe Heyn, PeterPeterDe HeynBienstman, PeterPeterBienstmanBogaerts, WimWimBogaerts2021-10-232021-10-232016-051863-8880https://imec-publications.be/handle/20.500.12860/26898Backscattering in silicon microring resonators: a quantitative analysisJournal articlehttp://onlinelibrary.wiley.com/doi/10.1002/lpor.201500207/abstract