van Haren, RichardRichardvan HarenSteinert, SteffenSteffenSteinertMouraille, OrionOrionMourailleHermans, JanJanHermansvan Dijk, LeonLeonvan DijkBeyer, DirkDirkBeyer2022-01-272021-11-022022-01-272022-01-2720200277-786XWOS:000632703600023https://imec-publications.be/handle/20.500.12860/38065The mask contribution as part of the intra-field on-product overlay performanceProceedings paper10.1117/12.2573190978-1-5106-3844-0WOS:000632703600023