Noda, T.T.NodaEyben, PierrePierreEybenVandervorst, WilfriedWilfriedVandervorstVrancken, ChristaChristaVranckenRosseel, ErikErikRosseelOrtolland, ClaudeClaudeOrtollandClarysse, TrudoTrudoClarysseGoossens, JozefienJozefienGoossensDe Keersgieter, AnAnDe KeersgieterFelch, S.S.FelchSchreutelkamp, RobRobSchreutelkampAbsil, PhilippePhilippeAbsilJurczak, GosiaGosiaJurczakDe Meyer, KristinKristinDe MeyerBiesemans, SergeSergeBiesemansHoffmann, Thomas Y.Thomas Y.Hoffmann2021-10-172021-10-172008https://imec-publications.be/handle/20.500.12860/14219Advanced 2D/3D simulations for laser annealed device using an atomic kinetic monte carlo approach and scanning spreading resistance microscopy (SRRM)Proceedings paper