Relation between breakdown mode and breakdown location in short channel NMOSFETs and its impact on reliability specifications

Degraeve, RobinRobinDegraeveKaczer, BenBenKaczerDe Keersgieter, AnAnDe KeersgieterGroeseneken, GuidoGuidoGroeseneken2021-10-142021-10-142001https://imec-publications.be/handle/20.500.12860/5228Relation between breakdown mode and breakdown location in short channel NMOSFETs and its impact on reliability specificationsProceedings paper