Bemelmans, HildeHildeBemelmansBorghs, GustaafGustaafBorghsLangouche, G.G.Langouche2021-09-292021-09-291994https://imec-publications.be/handle/20.500.12860/30Determination of the decay rate of photoionized Te atoms implanted in GaAs and Al0.3Ga0.7AsJournal article