A physics-based VLSI interconnect model including substrate and conductor skin effects

Ymeri, H.H.YmeriNauwelaers, BartBartNauwelaersMaex, KarenKarenMaexDe Roest, DavidDavidDe Roest2021-10-152021-10-152004https://imec-publications.be/handle/20.500.12860/9965A physics-based VLSI interconnect model including substrate and conductor skin effectsJournal article