Van Thourhout, DriesDriesVan ThourhoutZhang, L.L.ZhangYang, W.W.YangMiller, I.I.MillerSauer, N.J.N.J.SauerDoerr, C.R.C.R.Doerr2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/8303Journal article