Interface analysis of Ge ultra thin layers intercalated between GaAs substrates and oxide stacks

Molle, AlessandroAlessandroMolleLamagna, LucaLucaLamagnaSpiga, SabinaSabinaSpigaFanciulli, MarcoMarcoFanciulliBrammertz, GuyGuyBrammertzMeuris, MarcMarcMeuris2021-10-182021-10-1820100040-6090https://imec-publications.be/handle/20.500.12860/17650Interface analysis of Ge ultra thin layers intercalated between GaAs substrates and oxide stacksJournal articlehttp://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6TW0-4XGPKGB-3&_user=799533&_coverDate=10%2F19%2F2009&_alid=1057327845