Accurate characterization of some radiative EMC phenomena at chip level, using dedicated EMC-testchips

Criel, StevenStevenCrielBonjean, F.F.BonjeanDe Smedt, R.R.De SmedtDe Moerloose, JanJanDe MoerlooseMartens, LucLucMartensOlyslager, FrankFrankOlyslagerDe Zutter, DanielDanielDe Zutter2021-09-302021-09-301998https://imec-publications.be/handle/20.500.12860/2466Accurate characterization of some radiative EMC phenomena at chip level, using dedicated EMC-testchipsProceedings paper