Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study

Kaczer, BenBenKaczerDegraeve, RobinRobinDegraeveRasras, MahmoudMahmoudRasrasDe Keersgieter, AnAnDe KeersgieterVan de Mieroop, KoenKoenVan de MieroopGroeseneken, GuidoGuidoGroeseneken2021-10-142021-10-142002https://imec-publications.be/handle/20.500.12860/6461Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case studyJournal article