A single device based Voltage Step Stress (VSS) technique for fast reliability screening

Ji, Z.Z.JiZhang, J. F.J. F.ZhangZhang, W. D.W. D.ZhangZhang, X.X.ZhangKaczer, BenBenKaczerDe Gendt, StefanStefanDe GendtGroeseneken, GuidoGuidoGroesenekenRen, P.P.RenWang, R.R.WangHuang, R.R.Huang2021-10-222021-10-222014https://imec-publications.be/handle/20.500.12860/24008A single device based Voltage Step Stress (VSS) technique for fast reliability screeningProceedings paperhttp://dx.doi.org/10.1109/IRPS.2014.6861145