Low frequency noise analysis and modeling in vertical tunnel FETs with Ge Source

Neves, FelipeFelipeNevesAgopian, Paula G. D.Paula G. D.AgopianMartino, Joao A.Joao A.MartinoCretu, BogdanBogdanCretuRooyackers, RitaRitaRooyackersVandooren, AnneAnneVandoorenSimoen, EddyEddySimoenThean, AaronAaronTheanClaeys, CorCorClaeys2021-10-232021-10-2320160018-9383https://imec-publications.be/handle/20.500.12860/27074Low frequency noise analysis and modeling in vertical tunnel FETs with Ge SourceJournal articlehttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7428915