Kobayashi, MasaharuMasaharuKobayashiMitard, JeromeJeromeMitardIrisawa, ToshifumiToshifumiIrisawaHoffmann, Thomas Y.Thomas Y.HoffmannMeuris, MarcMarcMeurisSaraswat, KrishnaKrishnaSaraswatNishi, YoshioYoshioNishiHeyns, MarcMarcHeyns2021-10-192021-10-1920110018-9383https://imec-publications.be/handle/20.500.12860/19188On the high-field transport and uniaxial stress effect in Ge PFETsJournal article