Schreurs, DominiqueDominiqueSchreursVerspecht, J.J.VerspechtVandenberghe, S.S.VandenbergheCarchon, GeertGeertCarchonvan der Zanden, KoenKoenvan der ZandenNauwelaers, BartBartNauwelaers2021-10-142021-10-141999https://imec-publications.be/handle/20.500.12860/3807Easy and accurate empirical transistor model parameter estimation from vectorial large-signal measurementsProceedings paper