Ji, Z.Z.JiZhang, J.F.J.F.ZhangZhang, W.W.ZhangGroeseneken, GuidoGuidoGroesenekenPantisano, LuigiLuigiPantisanoDe Gendt, StefanStefanDe GendtHeyns, MarcMarcHeyns2021-10-172021-10-1720090003-6951https://imec-publications.be/handle/20.500.12860/15541An assessment of the mobility degradation induced by remote charge scatteringJournal article