Effects of detrapping on electron traps generated in gate oxides

Zhang, W.D.W.D.ZhangZhang, J.F.J.F.ZhangLalor, M.J.M.J.LalorBurton, D.R.D.R.BurtonGroeseneken, GuidoGuidoGroesenekenDegraeve, RobinRobinDegraeve2021-10-152021-10-152003https://imec-publications.be/handle/20.500.12860/8435Effects of detrapping on electron traps generated in gate oxidesJournal article