Single event latch-up: increased sensitivity from planar to FinFET

Karp, JamesJamesKarpHart, Michael J.Michael J.HartMaillard, PierrePierreMaillardHellings, GeertGeertHellingsLinten, DimitriDimitriLinten2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/28643Single event latch-up: increased sensitivity from planar to FinFETProceedings paperhttp://www.nsrec.com/program---wednesday.html