Li, YunlongYunlongLiCroes, KristofKristofCroesKirimura, TomoyukiTomoyukiKirimuraSiew, Yong KongYong KongSiewTokei, ZsoltZsoltTokei2021-10-202021-10-202012https://imec-publications.be/handle/20.500.12860/21019Copper electromigration failure times evaluated over a wide range of voiding phasesProceedings paper