Ronchi, NicoloNicoloRonchiRagnarsson, Lars-AkeLars-AkeRagnarssonCelano, UmbertoUmbertoCelanoKaczer, BenBenKaczerKaczmarek, JakubJakubKaczmarekBanerjee, KaustuvKaustuvBanerjeeMcMitchell, SeanSeanMcMitchellVan den Bosch, GeertGeertVan den BoschVan Houdt, JanJanVan Houdt2023-06-152023-06-1520222330-7978WOS:000869001800022https://imec-publications.be/handle/20.500.12860/41736A comprehensive variability study of doped HfO2 FeFET for memory applicationsProceedings paper10.1109/IMW52921.2022.9779294978-1-6654-9947-7WOS:000869001800022