Oxide and Interface Degradation Resulting from Substrate Hot-Hole Injection at 295K and 77K

Van den bosch, G.G.Van den boschGroeseneken, GuidoGuidoGroesenekenMaes, HermanHermanMaesKlein, R.R.KleinSaks, N. S.N. S.Saks2021-09-292021-09-291994https://imec-publications.be/handle/20.500.12860/387Oxide and Interface Degradation Resulting from Substrate Hot-Hole Injection at 295K and 77KJournal article