Failure mode for p-GaN gates under forward gate stress with varying Mg concentration

Stoffels, SteveSteveStoffelsBakeroot, BenoitBenoitBakerootWu, Tian-LiTian-LiWuMarcon, DenisDenisMarconPosthuma, NielsNielsPosthumaDecoutere, StefaanStefaanDecoutereTallarico, A.N.A.N.TallaricoFiegna, C.C.Fiegna2021-10-242021-10-242017https://imec-publications.be/handle/20.500.12860/29508Failure mode for p-GaN gates under forward gate stress with varying Mg concentrationProceedings paperhttp://ieeexplore.ieee.org/document/7936310/