Ohtani, T.T.OhtaniHayama, K.K.HayamaTakakura, K.K.TakakuraKudou, T.T.KudouOhyama, H.H.OhyamaMercha, AbdelkarimAbdelkarimMerchaSimoen, EddyEddySimoenClaeys, CorCorClaeys2021-10-162021-10-162007https://imec-publications.be/handle/20.500.12860/12634Radiation damage in proton-irradiated stained Si n-MOSFETsOral presentation